Muab piv rau Gaussian beam, lub tiaj tus nqaj hlau profile tsis muaj tis tab sis muaj kev hloov pauv ntawm ntug, uas ua rau muaj zog hloov pauv tau zoo dua thiab thaj chaw me me uas cuam tshuam rau cov cua sov.
Lub zog ntawm lub tiaj tus nqaj yog huv si nyob rau hauv ib cheeb tsam muab ntau dua li Gaussian beam. Ib qho tshwj xeeb etched, welded, los yog txiav siv lub tiaj tiaj tiaj yuav raug ntau dua thiab yuav ua rau muaj kev puas tsuaj tsawg rau cov cheeb tsam ib puag ncig. Lub ntsiab zoo ntawm cov kab noj hniav tiaj tus ua rau lawv muaj txiaj ntsig rau ntau yam kev siv. Nyob rau hauv laser-induced puas puas threshold (LIDT) kev ntsuam xyuas thiab lwm yam metrology systems, ib tug zoo-txhais thiab zoo ib yam flat-top beam irradiance profile minimizes kev ntsuas tsis paub meej thiab statistical variation. Flat-top beams kuj muaj qhov zoo ntawm daim ntawv thov hauv ntau lub fluorescence microscopy, holography, thiab interferometry systems.
Koj yuav ntsuas li cas kaw qhov tseeb laser beam rau ib qho zoo tagnrho tiaj tus profile? Ib txoj hauv kev yog txhawm rau txheeb xyuas qhov flatness factor (Fn) ntawm lub teeb laser tiag tiag. Raws li tau piav qhia nyob rau hauv ISO 13694, qhov no yog xam los ntawm kev faib qhov nruab nrab irradiance tus nqi los ntawm qhov siab tshaj plaws irradiance tus nqi ntawm cov nqaj.
